Essential of electronics testing for digital, memory and mixed-signal VLSI citrcuits

Main Author: Bushnell, Michael L.
Format: Open Shelf
Published: Boston: KAP, 2000.
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245 1 0 |a Essential of electronics testing for digital, memory and mixed-signal VLSI citrcuits   |c Michael L. Bushnell, Vishwani D. Agrawal. 
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