Bushnell, M. L. (2000). Essential of electronics testing for digital, memory and mixed-signal VLSI citrcuits. Boston: KAP.
Chicago Style CitationBushnell, Michael L. Essential of Electronics Testing for Digital, Memory and Mixed-signal VLSI Citrcuits. Boston: KAP, 2000.
MLA CitationBushnell, Michael L. Essential of Electronics Testing for Digital, Memory and Mixed-signal VLSI Citrcuits. Boston: KAP, 2000.
Warning: These citations may not always be 100% accurate.