Ion Beam Analysis: Fundamentals and Applicationsl

Main Author: Nastasi, Michael Anthony
Other Authors: Mayer, James W., Wang, Yongqiang
Format: Open Shelf
Published: Boca Raton,California: CRC Press, Taylor & Francis Group, 2014.
Subjects:
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020 |a 9781439846384  
090 0 0 |a QC 702.7.B65   |b N374 2014 
100 0 |a Nastasi, Michael Anthony  
245 0 0 |a Ion Beam Analysis: Fundamentals and Applicationsl   |c Michael Nastasi, James W. Mayer, Yongqiang Wang. 
260 |a Boca Raton,California:   |b CRC Press, Taylor & Francis Group,   |c 2014. 
300 |a xx1, 450 pages:   |b illustration;   |c 24 cm. 
500 |a Includes index 
650 0 0 |a Ion bombardment  
700 1 |a Mayer, James W.  
700 1 |a Wang, Yongqiang  
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