Ion Beam Analysis: Fundamentals and Applicationsl
| Main Author: | Nastasi, Michael Anthony |
|---|---|
| Other Authors: | Mayer, James W., Wang, Yongqiang |
| Format: | Open Shelf |
| Published: |
Boca Raton,California:
CRC Press, Taylor & Francis Group,
2014.
|
| Subjects: |
| Item Description: |
Includes index |
|---|---|
| Physical Description: |
xx1, 450 pages: illustration; 24 cm. |
| ISBN: |
9781439846384 |