Fundamentals of modern VLSI devices

Main Author: Taur, Yuan
Other Authors: Ning, Tak H.
Format: Open Shelf
Published: New York: Cambrige University Press, c2009.
Subjects:
LEADER 00704pamja2200217 4500
001 0000026299_0009
005 20161117090000.0
002 0000001017
008 120811
020 |a 9780521832946  
090 0 0 |a TK7871.99.M44   |b .T382 2009 
100 1 |a Taur, Yuan  
245 1 0 |a Fundamentals of modern VLSI devices   |c Yuan Taur, Tak H. Ning. 
260 |a New York:   |b Cambrige University Press,   |c c2009. 
300 |a xxiii, 656 p.:   |b ill.;   |c 26 cm. 
504 |a Includes bibliographical references and index 
650 0 |a Metal oxide semiconductors, Complementary  
650 0 |a Integrated circuits   |x Very large scale integration  
650 0 |a Bipolar transistors  
700 1 |a Ning, Tak H.  
999 |a 0000031191