Value analysis tear-down : a new process for product development and innovation

Main Author: Sato, Yoshihiko.
Other Authors: Kaufman, J.Jerry.
Format: Open Shelf
Published: New York: Industrial Press, Inc, 2005
Subjects:
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100 1 |a Sato, Yoshihiko. 
245 0 0 |a Value analysis tear-down :   |b a new process for product development and innovation   |c Yoshihiko Sato, J.Jerry Kaufman 
248 1 0 |n Tahun 5. - 2003. - Bangi, Selangor : Penerbitan Pelangi 
260 |a New York:   |b Industrial Press, Inc,   |c 2005 
300 |a xv,124 ms.;   |c 19 cm. 
504 |a Includes index. 
650 0 0 |a New products. 
650 0 0 |a Industrial productivity. 
650 0 0 |a Value analysis (Cost control). 
650 0 0 |a Engineering economy. 
700 0 |a Kaufman, J.Jerry. 
852 0 0 |a Open Shelf 
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