Value analysis tear-down : a new process for product development and innovation
| Main Author: | Sato, Yoshihiko. |
|---|---|
| Other Authors: | Kaufman, J.Jerry. |
| Format: | Open Shelf |
| Published: |
New York:
Industrial Press, Inc,
2005
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| Subjects: |
| Physical Description: |
xv,124 ms.; 19 cm. |
|---|---|
| Bibliography: |
Includes index. |
| ISBN: |
0831132035 |