Sato, Y., & Kaufman, J. (2005). Value analysis tear-down: A new process for product development and innovation. New York: Industrial Press, Inc.
Chicago Style CitationSato, Yoshihiko., and J.Jerry Kaufman. Value Analysis Tear-down: A New Process for Product Development and Innovation. New York: Industrial Press, Inc, 2005.
MLA CitationSato, Yoshihiko., and J.Jerry Kaufman. Value Analysis Tear-down: A New Process for Product Development and Innovation. New York: Industrial Press, Inc, 2005.
Warning: These citations may not always be 100% accurate.