Value analysis tear-down : a new process for product development and innovation
Main Author: | Sato, Yoshihiko. |
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Other Authors: | Kaufman, J.Jerry. |
Format: | Open Shelf |
Published: |
New York:
Industrial Press, Inc,
2005
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Subjects: |
KKTM BALIK PULAU
Call Number: |
HD47 3 S38 2005 |
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Accession | Item Category | SMD | Status | Due Date | Notes |
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0000028422 | OPEN SHELF | BOOK | FINAL PROCESSING |