Value analysis tear-down : a new process for product development and innovation

Main Author: Sato, Yoshihiko.
Other Authors: Kaufman, J.Jerry.
Format: Open Shelf
Published: New York: Industrial Press, Inc, 2005
Subjects:

KKTM BALIK PULAU

Call Number: HD47 3 S38 2005
Accession Item Category SMD Status Due Date Notes
0000028421 OPEN SHELF BOOK FINAL PROCESSING