Value analysis tear-down : a new process for product development and innovation
| Main Author: | Sato, Yoshihiko. |
|---|---|
| Other Authors: | Kaufman, J.Jerry. |
| Format: | Open Shelf |
| Published: |
New York:
Industrial Press, Inc,
2005
|
| Subjects: |
KKTM BALIK PULAU
| Call Number: |
HD47 3 S38 2005 |
|---|
| Accession | Item Category | SMD | Status | Due Date | Notes |
|---|
| 0000028421 | OPEN SHELF | BOOK | FINAL PROCESSING |